Semiconductor Automated Test Equipment

Semiconductor automated test equipment (ATE) consists of various instruments or cards used for testing memory, digital, mixed signal and system-on-chip (SOC) components, both at the wafer and packaged stages. Driven by the demand in the consumer, computing, and communication markets, these test systems continue to evolve. To keep pace with innovation in the semiconductor industry, today’s ATE tester products must provide more functionality at higher speeds than ever before.

Programmable logic plays an important role in the development of ATE tester products by providing flexibility and scalability. Functions such as timing accuracy, memory control, digital signal processing (DSP) analysis, high-speed I/O capability, and jitter compliance are all served by programmable logic. Figure 1 shows a typical instrument card in an ATE system. With the increasing complexity of ATE testers, more intellectual property (IP) continues to be integrated within the programmable logic.

Teledom  offers a variety of IP cores that can be utilized in ATE test equipment. Memory interfaces such as DDR3 and RLDRAM III, or high-speed bus interfaces such as PCI Express, SFI, and SerialLite (a lightweight, high-bandwidth, point-to-point data protocol).

Figure 1. Typical Automated Test Equipment Test Station

Figure 1. Typical Automated Test Equipment Test Station